DefinePK

Abstract

Testing of analog circuit is a challenging domain compared to digital circuits. This is mainly due to the difficulty to access the internal nodes. To prevail this difficulty an approach is presented for testing of Analog circuits. In this paper a hierarchical method for detection, location and identification of a single catastrophic fault is proposed. The circuit under test (CUT) is analyzed with different values of components which can be faulty. The response of the circuit is analyzed considering few parameters for analysis. A Fault dictionary consisting of these parameters is developed. This method uses top down Hierarchal testing of the system. Using this proposed method, single catastrophic faults in an analog circuit can be identified.