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STRUCTURAL, MAGNETIC AND MAGNETO TRANSPORT PROPERTIES OF FESNTI HALF HEUSLER ALLOYS THIN FILM SYNTHESIZED BY ELECTRODEPOSITION METHOD


Article Information

Title: STRUCTURAL, MAGNETIC AND MAGNETO TRANSPORT PROPERTIES OF FESNTI HALF HEUSLER ALLOYS THIN FILM SYNTHESIZED BY ELECTRODEPOSITION METHOD

Authors: Arooj Fatima, Nizam Ahmad, Sidra Dildar, Muhammad Sajjad, Ghazal Sharmeen, Maryum Iram , Sadia Manzoor

Journal: Spectrum of Engineering Sciences

HEC Recognition History
Category From To
Y 2024-10-01 2025-12-31

Publisher: Sociology Educational Nexus Research Institute

Country: Pakistan

Year: 2025

Volume: 3

Issue: 10

Language: en

Keywords: X-ray diffractionstructuralThin filmmagneticFeSnTi Half Heusler AlloysMagneto Transport PropertiesSynthesizedElectrodeposition Method

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Abstract

Heusler alloys are ferromagnetic in nature but the tow of the ingredients of this alloy are itself not the magnetic. Heusler Alloy has been prodigious investigations from its recognition and discovery. FeSnTi based half Heusler alloy thin films are prepared by utilizing electrodeposition technique with varying applied voltage from 0.6 V to 1.0 V with an interval of 0.1 V. The electrodeposited FeSnTi thin films are characterized by XRD and VSM. XRD studies reveal mixed phases for the samples deposited at applied voltage of 0.6 V and 0.7 V. At 0.8 V of applied voltage, a chemical shift from mixed phases to pure cubic FeSnTi phase of half Heusler alloy thin film is observed. With further increase in applied voltage i.e. 1.0 V, only strengthening and phase stability of pure cubic FeSnTi phase of half Heuslar alloy thin film is observed. The ferromagnetic behavior is observed for all the samples. The highest value of saturation magnetization ‘Ms’ and coercivity ‘Hc’ i.e. ‘49.0 emu/cm3’ and ‘925.9 Oe’ of FeSnTi Heusler alloy thin film is observed at 1.0 V of applied voltage due to the formation of pure cubic FeSnTi stable and strengthened phase. Magnetocrystalline anisotropy (Keff) is calculated to be 9.77E+9 erg/cm3. Magneto transport properties are investigated for the optimized sample of Heuslar alloy thin films.


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